FinFET/GAA Modeling for IC Simulation and Design
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FinFET/GAA Modeling for IC Simulation and Design
Using the BSIM-CMG Standard
Chauhan, Yogesh Singh; Dasgupta, Avirup; Vanugopalan, Sriramkumar; Hu, Chenming; Duarte, Juan Pablo; Khandelwal, Sourabh; Payvadosi, Navid; Pahwa, Girish; Niknejad, Ali; Lu, Darsen
Elsevier Science & Technology
06/2024
352
Mole
Inglês
9780323957298
Pré-lançamento - envio 15 a 20 dias após a sua edição
Descrição não disponível.
FinFET-From device concept to standard compact model
Compact models for analog and RF applications
Core model for FinFETs
Gate-all-around FETs
Channel current and real device effects
Leakage currents
Charge, capacitance, and nonquasi-static effects
Parasitic resistances and capacitances
Noise
Junction diode I-V and C-V models
Benchmark tests for compact models
BSIM-CMG model parameter extraction
Temperature dependence
Cryogenic temperature modelling
Compact models for analog and RF applications
Core model for FinFETs
Gate-all-around FETs
Channel current and real device effects
Leakage currents
Charge, capacitance, and nonquasi-static effects
Parasitic resistances and capacitances
Noise
Junction diode I-V and C-V models
Benchmark tests for compact models
BSIM-CMG model parameter extraction
Temperature dependence
Cryogenic temperature modelling
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
FinFET; GAA; BSIM-CMG; cryogenic modeling
FinFET-From device concept to standard compact model
Compact models for analog and RF applications
Core model for FinFETs
Gate-all-around FETs
Channel current and real device effects
Leakage currents
Charge, capacitance, and nonquasi-static effects
Parasitic resistances and capacitances
Noise
Junction diode I-V and C-V models
Benchmark tests for compact models
BSIM-CMG model parameter extraction
Temperature dependence
Cryogenic temperature modelling
Compact models for analog and RF applications
Core model for FinFETs
Gate-all-around FETs
Channel current and real device effects
Leakage currents
Charge, capacitance, and nonquasi-static effects
Parasitic resistances and capacitances
Noise
Junction diode I-V and C-V models
Benchmark tests for compact models
BSIM-CMG model parameter extraction
Temperature dependence
Cryogenic temperature modelling
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
