Principles of Electron Optics, Volume 4

Part XIV Electron-specimen Interactions 69. Electron Interactions in Thin Specimens

Part XV Digital Image Processing 70. Introduction 71. Acquisition, Sampling and Coding 72. Enhancement 73. Linear Restoration 74. Nonlinear Restoration - the Phase Problem 75. Three-dimensional Reconstruction 76. Image Analysis 77. Instrument Control and Instrumental Image Manipulation

Part XVI Coherence, Brightness and Spectral Functions 78. Coherence and the Brightness Functions 79. Wigner Optics

Part XVII Vortex Studies, the Quantum Electron Microscope 80. Orbital Angular Momentum, Vortex Beams and the Quantum Electron Microscope

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Aberration measurement; Aberration space; Ambiguity function; Bloch waves; Brightness; Cepstrum; Classification; Compass-gradient masks; Constraints; Deep learning; Degeneracy; Degrees of freedom; Density matrix; Direct and iterative approaches; Discrete geometry; Dynamical theory; Exit-wave reconstruction; Extended Wiener filter; Feature extraction; Fienup; Gerchberg-Saxton algorithm; Histogram equalization; Hoenders' procedure; Hoenders' procedure; Holography; Huffman code; Image algebra; Image processing; Image transform codes; Kinematic theory; Kirsch; Knots and links; Lensless Fourier transform holography; Machine learning; Magnetic fields; Mathematical morphology; Measurement using crystalline specimens; Median filter; Missing cone; Missing wedge; Morphological filter; Multiple scattering; Multislice electron optics; Multislice simulation; Mutual intensity; Orbital angular momentum; Partial coherence; Phase; Phase problem; Preprocessing; Probabilistic approaches; Ptycho-tomography; Quantum electron microscope; Radon transform; Rank-order filter; Recursive filtering; Sampling theorem; Scattering; Segmentation; Sobel; Three-dimensional reconstruction; Topological charge measurement; Transport-of-intensity equation; Vector codes; Vortex beam production; Vortex beams; Wigner function