Sensors, Circuits, and Systems for Scientific Instruments
-10%
portes grátis
Sensors, Circuits, and Systems for Scientific Instruments
Fundamentals and Front-Ends
Mandal, Soumyajit
Elsevier Science & Technology
04/2025
700
Mole
9780323950664
Pré-lançamento - envio 15 a 20 dias após a sua edição
Descrição não disponível.
Section 1: Fundamentals 1 Review of Linear Systems 2 General Properties of Measurement Systems Section 2: Devices 3 Review of Semiconductor Device Physics 4 Models of Electronic Devices 5 Sensors and Actuators 6 Models of Sensors and Actuators 7 Noise in Devices Section 3: Circuits 8 Noise in Circuits 9 Low-Noise Front-End Design 10 Precision Circuit Techniques 11 High-Power Front-End Design 12 Oscillators and Frequency References 13 Digitization Section 4: Signals and Data Processing 14 Review of Digital Signal Processing 15 Embedded Processing 16 Optimal Filtering and Signal Detection 17 Pattern Recognition and Machine Learning Section 5: System Design and Integration 18 System-Level Design and Simulation 19 System Integration and Deployment Section 6: Applications 20 Measurements in Extreme Environments 21 Medical Imaging: MRI 22 Medical Imaging: Ultrasound 23 Radio Astronomy 24 High-Energy Physics 25 Detection of Gravitational Waves
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Adler's equation; Allan deviation; all-digital PLLs; antenna noise models; Barkhausen criterion; bipolar junction transistors (BJTs); blackbody spectrum; capacitors; capture and lock range; Clocks; delay-locked loops (DLLs); describing function analysis; diodes; direct digital synthesis (DDS); electrical oscillators; electromechanical oscillators; field-effect transistors (FETs); flicker noise; fluctuation dissipation theorem (FDT); frequency counters; frequency stability; frequency synthesizers; Friis formula; GPS-disciplined oscillators (GPSDOs); inductors; injection locking; input impedance matching; international system of units (SI); JFETs; jitter; low-frequency noise; MOSFETs; noise matching; noise models; oscillator ageing; phase detectors; phase noise; Phase-locked loops (PLLs); Resistors; shot noise; spectrum analyzers; Temperature; thermal noise; thermodynamics; transformers; voltage-controlled oscillators (VCOs);
Section 1: Fundamentals 1 Review of Linear Systems 2 General Properties of Measurement Systems Section 2: Devices 3 Review of Semiconductor Device Physics 4 Models of Electronic Devices 5 Sensors and Actuators 6 Models of Sensors and Actuators 7 Noise in Devices Section 3: Circuits 8 Noise in Circuits 9 Low-Noise Front-End Design 10 Precision Circuit Techniques 11 High-Power Front-End Design 12 Oscillators and Frequency References 13 Digitization Section 4: Signals and Data Processing 14 Review of Digital Signal Processing 15 Embedded Processing 16 Optimal Filtering and Signal Detection 17 Pattern Recognition and Machine Learning Section 5: System Design and Integration 18 System-Level Design and Simulation 19 System Integration and Deployment Section 6: Applications 20 Measurements in Extreme Environments 21 Medical Imaging: MRI 22 Medical Imaging: Ultrasound 23 Radio Astronomy 24 High-Energy Physics 25 Detection of Gravitational Waves
Este título pertence ao(s) assunto(s) indicados(s). Para ver outros títulos clique no assunto desejado.
Adler's equation; Allan deviation; all-digital PLLs; antenna noise models; Barkhausen criterion; bipolar junction transistors (BJTs); blackbody spectrum; capacitors; capture and lock range; Clocks; delay-locked loops (DLLs); describing function analysis; diodes; direct digital synthesis (DDS); electrical oscillators; electromechanical oscillators; field-effect transistors (FETs); flicker noise; fluctuation dissipation theorem (FDT); frequency counters; frequency stability; frequency synthesizers; Friis formula; GPS-disciplined oscillators (GPSDOs); inductors; injection locking; input impedance matching; international system of units (SI); JFETs; jitter; low-frequency noise; MOSFETs; noise matching; noise models; oscillator ageing; phase detectors; phase noise; Phase-locked loops (PLLs); Resistors; shot noise; spectrum analyzers; Temperature; thermal noise; thermodynamics; transformers; voltage-controlled oscillators (VCOs);