Advances in Imaging and Electron Physics

Preface
Martin Hytch and Peter W. Hawkes
1. Measuring elastic strains and orientation gradients by scanning electron microscopy: Conventional and emerging methods
Clement Ernould, Benoit Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
2. Development of a global homography-based approach for high-angular resolution in the SEM
Clement Ernould, Benoit Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
3. Implementing the homography-based global approach
Clement Ernould, Benoit Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
4. Numerical validation and influence of optical distorsions on accuracy
Clement Ernould, Benoit Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy
5. Applications of the method
Clement Ernould, Benoit Beausir, Jean-Jacques Fundenberger,Vincent Taupin and Emmanuel Bouzy
6. Spin wave physics: The nonlinear spin wave-electromagnetic interaction and implications for high frequency devices
Clifford M. Krowne

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• Dispositivos e materiais electrónicos
• Engenharia mecânica
• Processamento de sinais

Accuracy; EBSD; Elastic strains; Ferrite magnetic materials; GND; Grain internal disorientation; High-angular resolution; Homography; HR-EBSD; HR-TKD; IC-GN; Indexing; Limiters; Limiting electromagnetic (EM) signals from antennas; Magnetodynamic equations of motion; Nanostructure; Nonlinear interaction; Optical distortion; Orientation imaging microscopy; Scanning electron microscopy; Spin waves; TKD